INFRARED-ABSORPTION IN THICK-FILM RESISTORS

Infrared absorption in polymer and glass-based thick film resistors ha s been measured between 400 and 1500 cm(-1). Sam pie structures are di scussed on the basis of X-ray, Fourier transform-infrared and resistan ce-temperature data. It is shown that in polymer-based thick film resi stors, the particulate phase is mostly responsible for the infrared ab sorption between 400 and 900 cm(-1), whereas the infrared absorption a t higher wave numbers is related to the continuous phase. In glass-bas ed thick film resistors, absorption is mostly determined by the highly doped glass. The results indicate that thick film resistors can be us ed as an absorbent coating in the 400-1500 cm(-1) region by suitable s election of the continuous and particulate phases.