Ca. Estrada et al., ELECTRON AND X-RAY-DIFFRACTION STUDIES OF CHEMICALLY DEPOSITED THIN-FILMS OF CADMIUM SELENIDE FOLLOWING REACTION WITH MERCURY(II) CHLORIDE SOLUTION, Heteroatom chemistry, 6(4), 1995, pp. 349-354
The reaction between thin films of CdSe and aqueous HgCl2 was studied
using electron diffraction (ED) powder X-ray diffraction (XRD), and X-
ray photoelectron spectroscopy (XPS). It was found that alpha-Hg3Se2Cl
2 is formed in the CdSe film following its reaction with 0.01 M HgCl2
for a period of 5 minutes. Upon completion of the reaction of CdSe pow
der with 0.01 M HgCl2, Hg2Cl2 is present in addition to alpha-Hg3Se2Cl
2 in a molar ratio of 1:3.1. The effect of air annealing on CdSe powde
r was also studied. Heating in air to 450 degrees C for 1 hour resulte
d in an XRD pattern corresponding to the hexagonal form CdSe.