ELECTRON AND X-RAY-DIFFRACTION STUDIES OF CHEMICALLY DEPOSITED THIN-FILMS OF CADMIUM SELENIDE FOLLOWING REACTION WITH MERCURY(II) CHLORIDE SOLUTION

Authors
ESTRADA CA MEYERS EA ZINGARO RA DUFNER DC NAIR PK NAIR MTS
Citation
Ca. Estrada et al., ELECTRON AND X-RAY-DIFFRACTION STUDIES OF CHEMICALLY DEPOSITED THIN-FILMS OF CADMIUM SELENIDE FOLLOWING REACTION WITH MERCURY(II) CHLORIDE SOLUTION, Heteroatom chemistry, 6(4), 1995, pp. 349-354
Citations number
12
Categorie Soggetti
Chemistry
Journal title
Heteroatom chemistry → ACNP
ISSN journal
10427163
Volume
6
Issue
4
Year of publication
1995
Pages
349 - 354
Database
ISI
SICI code
1042-7163(1995)6:4<349:EAXSOC>2.0.ZU;2-M
Abstract
The reaction between thin films of CdSe and aqueous HgCl2 was studied using electron diffraction (ED) powder X-ray diffraction (XRD), and X- ray photoelectron spectroscopy (XPS). It was found that alpha-Hg3Se2Cl 2 is formed in the CdSe film following its reaction with 0.01 M HgCl2 for a period of 5 minutes. Upon completion of the reaction of CdSe pow der with 0.01 M HgCl2, Hg2Cl2 is present in addition to alpha-Hg3Se2Cl 2 in a molar ratio of 1:3.1. The effect of air annealing on CdSe powde r was also studied. Heating in air to 450 degrees C for 1 hour resulte d in an XRD pattern corresponding to the hexagonal form CdSe.