TRACER-DIFFUSION STUDY OF CU+ DIFFUSION IN CUBR

Citation
Je. Jorgensen et al., TRACER-DIFFUSION STUDY OF CU+ DIFFUSION IN CUBR, Physical review. B, Condensed matter, 52(2), 1995, pp. 1004-1008
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
52
Issue
2
Year of publication
1995
Pages
1004 - 1008
Database
ISI
SICI code
0163-1829(1995)52:2<1004:TSOCDI>2.0.ZU;2-C
Abstract
Diffusion coefficients for Cu+ diffusion in the gamma, beta, and alpha phases of CuBr have been measured with an in situ tracer diffusion te chnique. The diffusion in the gamma and beta phases obeys an Arrhenius law within measured temperature ranges and the activation energies we re found to be 1.21(7) and 0.324(1) eV, respectively. A comparison of diffusion coefficients measured by the in situ tracer diffusion techni que and diffusion coefficients calculated from conductivity data sugge sts that a noncharge carrying diffusion mechanism is operational in th e copper halides.