Techniques for improved copper chemical vapour deposition (CVD) proces
sing by the addition of trimethylvinylsilane (tmvs) and hexafluoroacet
ylacetone (Hhfac) during copper deposition from the volatile liquid pr
ecursor Cu(hfac)(tmvs) are described. The tmvs enables stable high vap
orization rates of precursor by direct liquid injection and the Hhfac
permits higher deposition rates of smoother copper films. The resistiv
ity of the copper films averages approximately 1.8 mu Omega cm as depo
sited. Combined together, these results mark an important advance towa
rd a manufacturable copper CVD process.