T. Inoue et al., PREPARATION OF NITROGEN-CONTAINING CARBON-FILMS USING CHEMICAL-VAPOR-DEPOSITION ENHANCED BY ELECTRON-CYCLOTRON-RESONANCE PLASMA, Applied physics letters, 67(3), 1995, pp. 353-355
A chemical vapor deposition apparatus enhanced by electron cyclotron r
esonance plasma was employed to deposit nitrogen containing carbon fil
ms. In the apparatus, negative de bias voltage was applied to the subs
trate for acceleration of positive ions toward the substrate. The depo
sition rate and nitrogen content of the film was found to be mainly de
pendent upon the deposition conditions. Although a large N-2 flow rate
and bias voltage contribute to inhibit film growth through surface sp
uttering of the substrate, an optimum [N-2]/([CH4]+[N-2]) flow rate of
0.67 and a bias voltage of 50 V promote nitrogen implantation into th
e growing films through possible nitrogen ion bombardment. (C) 1995 Am
erican Institute of Physics.