X. Chen et al., DEGRADATION OF A THIN POLYMER FILM STUDIED BY SIMULTANEOUS IN-SITU ATOMIC FORCE MICROSCOPY AND SURFACE-PLASMON RESONANCE ANALYSIS, Journal of physical chemistry, 99(29), 1995, pp. 11537-11542
A new in situ method of analyzing changes occurring to polymeric surfa
ces has been generated by the combination of atomic force microscopy (
AFM) and surface plasmon resonance (SPR) in a novel instrument which c
an simultaneously acquire data from these two techniques. The applicat
ion of this;instrument provides new insights into the dynamic changes
occurring to a thin biodegradable polymer film when the surface of thi
s film is exposed to a hydrolyzing environment. The AFM data enable th
e visualization of the topographical changes that result from degradat
ion, whilst the SPR monitors the kinetics of the removal of polymer ma
terial from the film surface. The degradation of a spun cast thin film
of a poly(ortho ester) is analyzed in this study. The,combined AFM/SP
R data record the erosion of the thin film on the SPR sensor as degrad
ation progresses. The pH sensitivity of the hydrolysis of the poly(ort
ho ester) film is explored by dynamically altering the pH during degra
dation to highlight the sensitivity of the instrument in the quantific
ation of the degradation process.