THE AC ELECTRICAL BEHAVIOR OF POLYCRYSTALLINE YTTRIA

Citation
Vd. Patton et al., THE AC ELECTRICAL BEHAVIOR OF POLYCRYSTALLINE YTTRIA, Journal of applied physics, 78(3), 1995, pp. 1757-1762
Citations number
23
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
3
Year of publication
1995
Pages
1757 - 1762
Database
ISI
SICI code
0021-8979(1995)78:3<1757:TAEBOP>2.0.ZU;2-#
Abstract
The ac electrical behavior of the polycrystalline yttria was evaluated in the temperature range of 800-1300 degrees C in air as a function o f frequency (5 Hz less than or equal to f less than or equal to 13 MHz ). Resistance-temperature and resistance-time (aging) characteristics were examined using immittance measurements and electron microscopy to establish microstructure-property relationships. The ac electrical da ta indicated two distinct relaxations when analyzed in the impedance p lane. These relaxations are attributed to the lumped grain and grain-b oundary contributions in conjunction with a polarization effect at the electrode/sample interface. The admittance plane analysis revealed a semicircular relaxation in the low-frequency region, indicative of a t rapping effect associated with grain-boundaries and the electrode/samp le interface. The variation in the total electrical resistance with ti me is found to be dependent on the starting microstructure of the samp le. A sample with a larger grain size shows a smaller degree of aging at elevated temperatures. Immittance measurements suggest that the maj or contribution to the aging behavior comes from the evolution in the microstructure. (C) 1995 American Institute of Physics.