The ac electrical behavior of the polycrystalline yttria was evaluated
in the temperature range of 800-1300 degrees C in air as a function o
f frequency (5 Hz less than or equal to f less than or equal to 13 MHz
). Resistance-temperature and resistance-time (aging) characteristics
were examined using immittance measurements and electron microscopy to
establish microstructure-property relationships. The ac electrical da
ta indicated two distinct relaxations when analyzed in the impedance p
lane. These relaxations are attributed to the lumped grain and grain-b
oundary contributions in conjunction with a polarization effect at the
electrode/sample interface. The admittance plane analysis revealed a
semicircular relaxation in the low-frequency region, indicative of a t
rapping effect associated with grain-boundaries and the electrode/samp
le interface. The variation in the total electrical resistance with ti
me is found to be dependent on the starting microstructure of the samp
le. A sample with a larger grain size shows a smaller degree of aging
at elevated temperatures. Immittance measurements suggest that the maj
or contribution to the aging behavior comes from the evolution in the
microstructure. (C) 1995 American Institute of Physics.