SURFACE IMPEDANCE MEASUREMENTS OF SUPERCONDUCTING V3SI FILMS BY A MICROSTRIP RESONATOR TECHNIQUE

Authors
ANDREONE A CASSINESE A DICHIARA A SALLUZZO M VAGLIO R ATTANASIO C MARITATO L
Citation
A. Andreone et al., SURFACE IMPEDANCE MEASUREMENTS OF SUPERCONDUCTING V3SI FILMS BY A MICROSTRIP RESONATOR TECHNIQUE, Journal of applied physics, 78(3), 1995, pp. 1862-1865
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
78
Issue
3
Year of publication
1995
Pages
1862 - 1865
Database
ISI
SICI code
0021-8979(1995)78:3<1862:SIMOSV>2.0.ZU;2-J
Abstract
Using a ring microstrip resonator technique, the surface impedance of V3Si sputtered films has been measured as a function of temperature an d de and rf field amplitude. The results are analyzed in terms of the Bardeen-Cooper-Schrieffer theory and of a grain-boundary Josephson mod el, and discussed in the framework of the possible application of V3Si as a thin-film coating of superconducting rf cavities for particle ac celerators. (C) 1995 American Institute of Physics.