AN ATTEMPT TOWARDS QUANTITATIVE PHOTOTHERMAL MICROSCOPY

Citation
U. Seidel et al., AN ATTEMPT TOWARDS QUANTITATIVE PHOTOTHERMAL MICROSCOPY, Journal of applied physics, 78(3), 1995, pp. 2050-2056
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
3
Year of publication
1995
Pages
2050 - 2056
Database
ISI
SICI code
0021-8979(1995)78:3<2050:AATQPM>2.0.ZU;2-E
Abstract
Based on the description of photothermal image formation as a convolut ion between a defect distribution and the photothermal point spread fu nction, a technique is presented by which subsurface thermal inhomogen eities can be quantitatively reconstructed from photothermal images. N umerical simulations demonstrate the performance and the limits of the suggested approach. Experimental results obtained from a low thermal contrast sample are presented and compared with the theory. (C) 1995 A merican Institute of Physics.