We report the results of an investigation to grow thin Si films on Si
substrates at low substrate temperatures using ionized SiH4 gas genera
ted with a Kaufman type ion gun. This investigation shows island-growt
h at higher substrate temperatures (500-700 degrees C) in the form of
square-based pyramids. By lowering the substrate temperature to 300 de
grees C, we were able to achieve a planar growth with a growth rate of
8 Angstrom per minute. Transmission electron microscopy (TEM) is used
to study the crystalline quality of the samples prepared at different
temperatures. The study by high resolution TEM of the sample grown at
300 degrees C indicates the presence of microtwins in the Si epi-laye
r. (C) 1995 American Institute of Physics.