ARTIFICIALLY LAYERED NANOCOMPOSITES FABRICATED BY JET VAPOR-DEPOSITION

Citation
Hng. Wadley et al., ARTIFICIALLY LAYERED NANOCOMPOSITES FABRICATED BY JET VAPOR-DEPOSITION, Composites engineering, 5(7), 1995, pp. 935
Citations number
20
Categorie Soggetti
Materials Sciences, Composites",Engineering
Journal title
ISSN journal
09619526
Volume
5
Issue
7
Year of publication
1995
Database
ISI
SICI code
0961-9526(1995)5:7<935:ALNFBJ>2.0.ZU;2-3
Abstract
Novel jet vapor deposition (JVD) processes offer considerable promise for the inexpensive synthesis of functionally graded (composite) mater ials (FGMs). Here, we explore microstructure-mechanical property relat ionships for a model Al/Cu metal-metal system and an Al/Al2O3 metal-me tal oxide multilayered nanocomposite system fabricated by the JVD proc ess. The 10 mu m thick Al/Cu multilayers were deposited on silicon waf ers at a substrate temperature of similar to 140 degrees C. The Al and Cu layers were of approximately equal thickness and were systematical ly varied from similar to 20 to similar to 1000 nm. The 20 mu m thick Al/Al2O3 multilayers were deposited on glass slides at similar to 250 degrees C. The oxide layer thickness was held constant in the similar to 2-6 nm range, whilst the Al layer thickness was systematically vari ed from similar to 3 to similar to 50 nm. The structure of the Al/Cu m ultilayers was polycrystalline and had a strong (111) texture, whereas the Al/Al2O3 multilayers consisted of amorphous aluminum oxide layers and polycrystalline metal layers with randomly oriented grains. The y ield strength of the Al/Cu multilayers exhibited an inverse dependence upon layer thickness when the layer spacing exceeded similar to 50 nm . When the Al/Cu layer spacing was thinner than similar to 50 nm, the strength was better predicted by a Koehler image force model. A simila r phenomenon was also found in the Al/Al2O3 multilayers. In this case the critical metal layer thickness for the transition from an Orowan t o a Koehler type behavior was approximately 25 nm. This is consistent with theoretical predictions which indicate that the critical layer th ickness of the low modulus consistuent decreases as the difference in shear moduli between the two constituent layers increases.