IMPURITY-FREE LAYER DISORDERING IN P-I-N AND N-I-P ALGAAS-GAAS MULTIPLE-QUANTUM-WELL DEVICE STRUCTURES - THE FERMI-LEVEL EFFECT REVISITED

Citation
S. Seshadri et al., IMPURITY-FREE LAYER DISORDERING IN P-I-N AND N-I-P ALGAAS-GAAS MULTIPLE-QUANTUM-WELL DEVICE STRUCTURES - THE FERMI-LEVEL EFFECT REVISITED, Applied physics letters, 67(4), 1995, pp. 497-499
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
4
Year of publication
1995
Pages
497 - 499
Database
ISI
SICI code
0003-6951(1995)67:4<497:ILDIPA>2.0.ZU;2-O
Abstract
Spatially resolved values of the Al-Ga interdiffusion coefficient for p-i-n and n-i-p AlGaAs-GaAs device structures are found to be nearly i dentical in magnitude, but to vary with position by a factor of 2 acro ss a 1 mu m thick multiple quantum well active region. These observati ons are in marked contrast with theoretical predictions given that the Fermi level to valence-band energy separation changes by 0.7 eV acros s the intrinsic region and suggest that impurity-free layer disorderin g does not provide the necessary uniformity in energy shift for photon ic integrated circuit fabrication in its present state of development. (C) 1995 American Institute of Physics.