SURFACE EFFECTS IN BALLISTIC-ELECTRON-EMISSION MICROSCOPY

Citation
H. Sirringhaus et al., SURFACE EFFECTS IN BALLISTIC-ELECTRON-EMISSION MICROSCOPY, Surface science, 333, 1995, pp. 1277-1282
Citations number
15
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
333
Year of publication
1995
Part
B
Pages
1277 - 1282
Database
ISI
SICI code
0039-6028(1995)333:<1277:SEIBM>2.0.ZU;2-W
Abstract
Tn situ ballistic-electron-emission microscopy (BEEM) and scanning tun neling spectroscopy have been performed at 77 K on CoSi2/Si(111) films grown by molecular beam epitaxy. Different atomic surface structures induce significant variations of the BEEM current. For the first time periodic surface structures could be imaged at atomic resolution by BE EM. This surface effect is explained by the energy distribution of the injected electrons, which is influenced by surface-induced variations of the tunneling barrier height. Quantum size effects in the local de nsity of states can be correlated with subtle features in the BEEM spe ctra.