A NEW OPTICAL METHOD FOR INVESTIGATION OF THIN METAL-FILMS

Authors
KROO N KRIEGER W LENKEFI Z SZENTIRMAY Z THOST JP WALTHER H
Citation
N. Kroo et al., A NEW OPTICAL METHOD FOR INVESTIGATION OF THIN METAL-FILMS, Surface science, 333, 1995, pp. 1305-1309
Citations number
13
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
333
Year of publication
1995
Part
B
Pages
1305 - 1309
Database
ISI
SICI code
0039-6028(1995)333:<1305:ANOMFI>2.0.ZU;2-3
Abstract
A new optical method: the spatial intensity distribution measurement a nd analysis of light, emitted by surface plasmons excited at resonance conditions in an ATR equipment was tested at 632.8 and 1064 nm wavele ngths. Other methods to determine the plasmon decay length (scanning t unnel microscopy and the width of ATR curves) resulted in similar valu es for 30-80 nm thick Ag and Au films. An example of application is de monstrated.