CYCLOGEN - AUTOMATIC, FUNCTIONAL-LEVEL TEST GENERATOR BASED ON THE CYCLOMATIC COMPLEXITY MEASURE AND ON THE ROBDD REPRESENTATION

In this paper we have laid the foundations for a functional test gener ation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) fo r Boolean function manipulation, The CCM has been defined for single-o utput and multioutput electronic circuits. This measure computes the n umber of BDD paths to be transformed into test vectors. This new test generation approach, failed CYCLOGEN, has been implemented, and the te sts for several functional primitives, as well as the ISCAS-85 benchma rk circuits, have been generated successfully. The results show that t his approach is effective and promising.