STRUCTURAL INVESTIGATION OF LI2SIS3 GLASS USING X-RAY RDF

Authors
MURUGANANDAM K SESHASAYEE M
Citation
K. Muruganandam et M. Seshasayee, STRUCTURAL INVESTIGATION OF LI2SIS3 GLASS USING X-RAY RDF, Solid state communications, 95(8), 1995, pp. 499-502
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
95
Issue
8
Year of publication
1995
Pages
499 - 502
Database
ISI
SICI code
0038-1098(1995)95:8<499:SIOLGU>2.0.ZU;2-0
Abstract
We report an X-ray radial distribution function study of Li2SiS3 glass done using Mo K-alpha radiation. Si-S and Li-S interactions occur at 2.16 and 2.67 Angstrom respectively. Si is surrounded by four sulfur a toms. Two Si-Si interactions at 3.7 and 4.26 Angstrom confirm the abse nce of edge sharing among SiS4 tetrahedra. Li is surrounded by sulphur atoms at 2.67 Angstrom, with an average coordination number of 5.3. R esults are compared with those of the molecular dynamics study of the same glass.