HEAVY-ION-INDUCED X-RAY-EMISSION WORK AT THE TANDAR LABORATORY IN BUENOS-AIRES

Authors
OZAFRAN MJ VAZQUEZ ME ROMO ASMA CARDONA MA DEBRAY ME HOJMAN D KESQUE JM KREINER AJ MENENDEZ JJ SOMACAL H DAVIDSON J DAVIDSON M
Citation
Mj. Ozafran et al., HEAVY-ION-INDUCED X-RAY-EMISSION WORK AT THE TANDAR LABORATORY IN BUENOS-AIRES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 384-386
Citations number
3
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
99
Issue
1-4
Year of publication
1995
Pages
384 - 386
Database
ISI
SICI code
0168-583X(1995)99:1-4<384:HXWATT>2.0.ZU;2-X
Abstract
The PIXE technique, using heavy ions beams, has been implemented at th e TANDAR tandem facility in Buenos Aires. Mainly O-16 beams in the bom barding energy range E = 30-50 MeV have been used and a systematic mea surement of X-ray production cross sections has been performed. The te chnique has been applied to a variety of subjects, including environme ntal, biomedical and industrial problems.