DEFECTS IN SPUTTER-DEPOSITED ALUMINUM FILMS, STUDIED BY X-RAY-DIFFRACTION AND POSITRON-ANNIHILATION

Authors
NANCHEVA N DOCHEVA P FESCHIEV N MISHEVA M DJOURELOV N
Citation
N. Nancheva et al., DEFECTS IN SPUTTER-DEPOSITED ALUMINUM FILMS, STUDIED BY X-RAY-DIFFRACTION AND POSITRON-ANNIHILATION, Scripta metallurgica et materialia, 33(4), 1995, pp. 575-581
Citations number
40
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
Journal title
Scripta metallurgica et materialia → ACNP
ISSN journal
0956716X
Volume
33
Issue
4
Year of publication
1995
Pages
575 - 581
Database
ISI
SICI code
0956-716X(1995)33:4<575:DISAFS>2.0.ZU;2-Q