M. Zharnikov et al., HOLOGRAPHY OF CLEAN AND SULFUR-COVERED NI (111) USING MULTIPLE WAVE-NUMBER PHOTOELECTRON DIFFRACTION PATTERNS/, Surface science, 334(1-3), 1995, pp. 114-134
Angular distributions of Ni 3p(3/2) photoelectrons for clean Ni(111) a
nd of S 2p(3/2) photoelectrons for the p(2 X 2)S and (5 root 3 X 2)S s
tructures on Ni(111) were measured at seven different kinetic energies
ranging from 239 to 417 eV for Ni 3p(3/2) and from 130 to 322.5 eV fo
r S 2p(3/2). From the photoelectron diffraction patterns, holographic
reconstructions were performed using (1) the single wave number recons
truction method and (2) the multiple wave number phased sum method. Fo
r the clean surface, neighboring atoms in the plane of the emitter and
some atoms in the second and third plane above the emitter can be ide
ntified; the holographic reconstruction in the first plane above the e
mitter is however dominated by intense artifacts. For Ni(111)-p(2 X 2)
S, the three-fold hollow fee adsorption site of sulphur can be unequiv
ocally identified with a distance to the first Ni layer of about 1.6 A
ngstrom. Holographic reconstructions for Ni(111)-(5 root 3 x 2)S allow
to exclude the three-fold hollow position of sulphur and disagree wit
h a proposed mixing of different non-symmetric adsorption sites. The d
istance of the sulphur atoms from the top Ni layer is determined to 1.
1-1.2 A. The reconstructions are consistent with a quasi-(100) reconst
ruction of the Ni(111) crystal surface. For all systems the potential
of using only an azimuthal sector instead of the full hemispherical ho
lograms for the reconstruction is discussed.