PHOTOELECTRON DIFFRACTION IMAGING OF A SURFACE ALLOY

Citation
Jg. Tobin et al., PHOTOELECTRON DIFFRACTION IMAGING OF A SURFACE ALLOY, Surface science, 334(1-3), 1995, pp. 263-275
Citations number
69
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
334
Issue
1-3
Year of publication
1995
Pages
263 - 275
Database
ISI
SICI code
0039-6028(1995)334:1-3<263:PDIOAS>2.0.ZU;2-I
Abstract
Photoelectron diffraction imaging (PDI) has been used to determine the surface structure of a surface alloy. Direct two-dimensional imaging of the surface plane has been achieved by Fourier transformation of ex perimental energy-dependent photoelectron diffraction (EDPD) data. Thi s imaging method, based upon the Fourier transformation of diffraction oscillations with energy and a summation over angular contributions, can provide vectorial atomic positions with atomic resolution. A new r apid data collection mode is introduced and tested by comparison with previously developed modes of photoelectron diffraction. Surface struc tural sensitivity was confirmed by comparison with multiple-scattering simulations. The previously ambiguous surface geometry of c(2 x 2) Au /Cu(001) has been determined, with clear, non-model-dependent discrimi nation of the surface alloy over the overlayer structure.