Metal-semiconductor-metal (MSM) photodiodes with submicron spaced inte
rdigitated Schottky barrier fingers have been developed for applicatio
ns in monolithic integrated optical receiver circuits capable of detec
ting a millimeter-wave modulation signal. Each photodetector layer, is
designed for optimal absorption about a narrow linewidth centered on
a specific wavelength between 700 and 800 ml. The MBE grown layers con
sist of: an AlxGa1-xAs cap layer, to prevent any surface recombination
of carriers and to minimize top surface reflections; a thin GaAs abso
rption layer (375 nm), to achieve a high-frequency response (>39 GHz)
by minimizing the collection times of optically generated carriers; an
d a buried Bragg reflector stack which reflects unabsorbed light back
into the GaAs absorption layer. Using this layer design, we are able t
o fabricate detectors that have millimeter-wave bandwidths without sac
rificing quantum efficiency. The measured internal quantum efficiency
of an MSM photodiode, fabricated on such a layer structure, was 82% at
5 V and close to 94% at 10 V.