Hj. Kim et Bw. James, THE USE OF FOURIER-TRANSFORM TECHNIQUES FOR THE ANALYSIS OF HOOK INTERFEROGRAMS, Optics communications, 118(5-6), 1995, pp. 542-545
Hook interferometry is widely used for the measurement of atomic oscil
lator strengths and atomic energy level populations. The application o
f Fourier transform techniques to the analysis of hook interferograms
is shown to produce greater precision in the determination of hook sep
aration by either the hook or vernier methods. Results obtained for co
pper density in a magnetron sputtering discharge are presented.