CHARACTERIZATION OF TELLURIUM-BASED CONVERSION COATINGS BY X-RAY-ABSORPTION NEAR-EDGE STRUCTURE AND FOURIER-TRANSFORM INFRARED-SPECTROSCOPY

Authors
SHAH S WARD A DAVENPORT AJ
Citation
S. Shah et al., CHARACTERIZATION OF TELLURIUM-BASED CONVERSION COATINGS BY X-RAY-ABSORPTION NEAR-EDGE STRUCTURE AND FOURIER-TRANSFORM INFRARED-SPECTROSCOPY, Corrosion, 51(1), 1995, pp. 67-70
Citations number
18
Categorie Soggetti
Metallurgy & Metallurigical Engineering
Journal title
Corrosion → ACNP
ISSN journal
00109312
Volume
51
Issue
1
Year of publication
1995
Pages
67 - 70
Database
ISI
SICI code
0010-9312(1995)51:1<67:COTCCB>2.0.ZU;2-K
Abstract
Tellurium (Te)-based conversion coatings grown at two different pH val ues were characterized by x-ray absorption near-edge structure (XANES) and Fourier transform infrared (FTIR) spectroscopy At pH 3.5, a brown coating formed that contained reduced forms of Te as Te(O) and Te(lV) . At pH 5.5, a colorless coating formed that contained traces of Te as Te(lV) and possibly Te(VI). Results suggested that iron (Fe) is solub le at low pH values and undergoes redox reactions with telluric acid, while at higher pH values, telluric acid thickens the passive film on Fe.