EXTRACTION OF THE TOPOLOGY OF EQUIVALENT-CIRCUITS BASED ON PARAMETER STATISTICAL EVOLUTION DRIVEN BY SIMULATED ANNEALING

Authors
COURAT JP RAYNAUD G SIARRY P
Citation
Jp. Courat et al., EXTRACTION OF THE TOPOLOGY OF EQUIVALENT-CIRCUITS BASED ON PARAMETER STATISTICAL EVOLUTION DRIVEN BY SIMULATED ANNEALING, International journal of electronics, 79(1), 1995, pp. 47-52
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
International journal of electronics → ACNP
ISSN journal
00207217
Volume
79
Issue
1
Year of publication
1995
Pages
47 - 52
Database
ISI
SICI code
0020-7217(1995)79:1<47:EOTTOE>2.0.ZU;2-O
Abstract
A new systematic methodology to extract an equivalent circuit from S p arameter measurements of any electronic device within a given frequenc y range is proposed. It is based on a progressive schematic pruning te chnique that derives from observation of the evolution of schematic pa rameters during a fitting process driven by simulated annealing.