This paper describes and presents the main characteristics of a series
of simulation-measurement facilities for studying IR photodetectors a
nd telescopes under conditions of low-level background irradiation. It
shows that multifunctional studies of IR devices are possible on appa
ratus based on a modular arrangement of separate deeply cooled simulat
ion and diagnostic systems. Along with sufficient completeness of the
characteristics being studied, this apparatus excels other existing ap
paratus of this class in most economical indicators, including capital
cost, energy consumption, etc.