MEASUREMENT OF DIFFUSE-X-RAY SCATTERING ON A 3-CRYSTAL X-RAY DIFFRACTOMETER

Authors
SHCHERBACHEV KD BUBLIK VT
Citation
Kd. Shcherbachev et Vt. Bublik, MEASUREMENT OF DIFFUSE-X-RAY SCATTERING ON A 3-CRYSTAL X-RAY DIFFRACTOMETER, Industrial laboratory, 60(8), 1994, pp. 473-477
Citations number
12
Categorie Soggetti
Materials Science, Characterization & Testing","Instument & Instrumentation
Journal title
Industrial laboratory → ACNP
ISSN journal
00198447
Volume
60
Issue
8
Year of publication
1994
Pages
473 - 477
Database
ISI
SICI code
0019-8447(1994)60:8<473:MODSOA>2.0.ZU;2-C
Abstract
Computer simulation for certain instrumental conditions is used to sho w the effect of geometrical (instrumental) experimental conditions on the determined exponent n describing the fall in the intensity of diff use scattering as a function of the scattering vector q. A slit monoch romator and analyzer are preferable for reducing the indicated effect.