OBSERVATION OF FIELD-INDUCED FRAGMENTATION OF NICKEL CLUSTERS USING SCANNING-TUNNELING-MICROSCOPY

Citation
Mvh. Rao et al., OBSERVATION OF FIELD-INDUCED FRAGMENTATION OF NICKEL CLUSTERS USING SCANNING-TUNNELING-MICROSCOPY, Applied surface science, 89(4), 1995, pp. 417-421
Citations number
10
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
89
Issue
4
Year of publication
1995
Pages
417 - 421
Database
ISI
SICI code
0169-4332(1995)89:4<417:OOFFON>2.0.ZU;2-L
Abstract
Thin films of nickel deposited on mica have a surface structure in the form of a uniform distribution of clusters of similar to 30 nm size. When an electrical pulse is applied to the film by the tip of an STM, these clusters get fragmented into smaller clusters. The fragmented cl usters so produced were observed to coalesce together to regain the or iginal morphology of the surface. The restoration process takes about 6 to 12 min depending on the height and width of the electrical pulse.