R. Helbig et al., THE EFFECT OF DEFECTIVE-DNA DOUBLE-STRAND BREAK REPAIR ON MUTATIONS AND CHROMOSOME-ABERRATIONS IN THE CHINESE-HAMSTER CELL MUTANT XR-V15B, Radiation research, 143(2), 1995, pp. 151-157
The radiosensitive Chinese hamster cell line XR-V15B was used to study
the effect of decreased rejoining of DNA double-strand breaks (DSBs)
on gene mutations and chromosome aberrations. XR-V15B cells are hypers
ensitive to the cytotoxic effects of neocarzinostatin (NCS) and methyl
methanesulfonate (MMS). Both mutagens induced more chromosome aberrat
ions in XR-V15B cells than in the parental cell strain. The clastogeni
c action of NCS was characterized by the induction of predominantly ch
romosome-type aberrations in cells of both strains, whereas MMS induce
d mainly chromatid aberrations. The frequency of induced gene mutation
s at the hprt locus was not increased compared to the parental V79 cel
ls when considering the same survival level. Molecular analysis by mul
tiplex polymerase chain reaction (PCR) of mutants induced by NCS revea
led a high frequency of deletions in cells of both cell lines. Methyl
methanesulfonate induced mainly mutations without visible changes in t
he PCR pattern, which probably represent point mutations. Our findings
suggest a link between a defect in DNA DSB repair and increased cytot
oxic and clastogenic effects. However, a decreased ability to rejoin D
NA DSBs does not seem to influence the incidence and types of gene mut
ations at the hprt locus induced by NCS and MMS. (C) 1995 by Radiation
Research Society