A SIMPLE VELOCITY MODEL FOR LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION

Citation
C. Aktik et S. Belkouch, A SIMPLE VELOCITY MODEL FOR LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Applied physics letters, 67(6), 1995, pp. 869-871
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
6
Year of publication
1995
Pages
869 - 871
Database
ISI
SICI code
0003-6951(1995)67:6<869:ASVMFL>2.0.ZU;2-X
Abstract
A new simple transport model is used to describe the dependence of the electrical characteristics of the epitaxial layer on the growth param eters in low-pressure metalorganic chemical vapor deposition. The impo rtant parameters of this model are the mean velocity of the gases and the [V]/[III] ratio. Undoped GaAs epitaxial layers are prepared at var ious operating pressures. A semi-empirical correlation relating the re actor pressure and flow rate is established that dictates the operatin g conditions for a single set of film properties. This enables growth of a material with constant characteristics while pressure can be vari ed. (C) 1995 American Institute of Physics.