MICROWAVE IMAGING OF THICK COMPOSITE PANELS WITH DEFECTS

Citation
N. Qaddoumi et al., MICROWAVE IMAGING OF THICK COMPOSITE PANELS WITH DEFECTS, Materials evaluation, 53(8), 1995, pp. 926-929
Citations number
14
Categorie Soggetti
Materials Science, Characterization & Testing
Journal title
ISSN journal
00255327
Volume
53
Issue
8
Year of publication
1995
Pages
926 - 929
Database
ISI
SICI code
0025-5327(1995)53:8<926:MIOTCP>2.0.ZU;2-E
Abstract
The results of an experimental study investigating the use of microwav es to inspect the presence of defects in thick composite structures ar e presented. Specially fabricated thick glass reinforced polymer compo site panels with several types of embedded defects are inspected using an open-ended rectangular waveguide sensor. A voltage related to the phase or magnitude of the effective reflection coefficient at the wave -guide aperture is used to create images of the sample. These images i ndicate the ability of microwaves for detecting and locating defects a nd voids of different sizes and shapes in such thick composites. For o ptimal detection, the influence of standoff distance between the senso r and the panels is also studied. Results indicate that the proper cho ice of standoff distance enhances paw detection capability.