HIGH-ACCURACY DISTANCE MEASUREMENTS WITH MULTIPLE-WAVELENGTH INTERFEROMETRY

Authors
DANDLIKER R HUG K POLITCH J ZIMMERMANN E
Citation
R. Dandliker et al., HIGH-ACCURACY DISTANCE MEASUREMENTS WITH MULTIPLE-WAVELENGTH INTERFEROMETRY, Optical engineering, 34(8), 1995, pp. 2407-2412
Citations number
14
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
34
Issue
8
Year of publication
1995
Pages
2407 - 2412
Database
ISI
SICI code
0091-3286(1995)34:8<2407:HDMWMI>2.0.ZU;2-K
Abstract
Multiple-wavelength interferometry is, like classical interferometry, a coherent method, but it offers great flexibility in sensitivity by a n appropriate choice of the different wavelengths and it can be operat ed on rough surfaces. The accuracy of this method depends essentially on the signal processing and on the properties of the source. Practica l considerations for distances in the range of several meters with mic rometer resolution are given.