LATTICE-CONSTANT DETERMINATION IN CUBIC T HIN-FILMS UNDER THERMAL STRAIN

Authors
ZENDEHROUD J WIEDER T THOMA K
Citation
J. Zendehroud et al., LATTICE-CONSTANT DETERMINATION IN CUBIC T HIN-FILMS UNDER THERMAL STRAIN, Materialwissenschaft und Werkstofftechnik, 26(7), 1995, pp. 386-393
Citations number
16
Categorie Soggetti
Material Science
Journal title
Materialwissenschaft und Werkstofftechnik → ACNP
ISSN journal
09335137
Volume
26
Issue
7
Year of publication
1995
Pages
386 - 393
Database
ISI
SICI code
0933-5137(1995)26:7<386:LDICTH>2.0.ZU;2-T
Abstract
An X-ray diffraction procedure is presented to determine the lattice c onstant of a cubic thin film which is thermally strained. The procedur e also gives the thermal strain. As application examples, the lattice constants of thin aluminium and copper films deposited by ion-platting are evaluated from grazing incidence diffraction data.