Two series of experiments were carried out. In the first, as-grown por
ous silicon was bombarded with Co-60 gamma radiation to a dose similar
to 10(20) cm(-2). The photoluminescence intensity fell off by a facto
r similar to 50 as a result, although the peak of the band underwent e
ssentially no shift. In the second series, single-crystal silicon was
bombarded to the same dose, and then porous silicon was fabricated on
it. The intensity and spectra of these samples were the same as usual.
Possible degradation mechanisms are discussed. (C) 1995 American Inst
itute of Physics.