The device developed by the authors and described here enables the use
r to measure the depth from the water surface to the point of measurem
ent for a cylindrical ion chamber with a waterproof plastic cap in a w
ater phantom, free of surface-tension error with a high precision. The
device seeks vertical orientation and provides the convenience of han
ds-free operation. The measurement process is simple and quick with a
precision of 0.1 mm. (The device is currently available as a 'water ph
antom depth gauge' from Nuclear Associates, Division of Victoreen Inc.
, Glare Place, NY, USA.)