ROUGH AND VICINAL SURFACES OF HE-4 CRYSTALS - MOBILITY MEASUREMENTS

Citation
J. Amrit et al., ROUGH AND VICINAL SURFACES OF HE-4 CRYSTALS - MOBILITY MEASUREMENTS, Journal of low temperature physics, 100(1-2), 1995, pp. 121-130
Citations number
21
Categorie Soggetti
Physics, Applied
ISSN journal
00222291
Volume
100
Issue
1-2
Year of publication
1995
Pages
121 - 130
Database
ISI
SICI code
0022-2291(1995)100:1-2<121:RAVSOH>2.0.ZU;2-Z
Abstract
By studying the transmission coefficient of ultrasonic waves perpendic ular to the solid-liquid interface, we have measured the mobility of v icinal surfaces of He-4 crystrals for different crystallographic orien tations and in the temperature range from 0.38 K to 1 K. The results s how an angular dependency of the vicinal mobility as predicted by theo ry. Further, in comparison with rough interfaces, a spectacular decrea se for the mobility of vicinal surfaces due to the decreasing number o f moving sites is in good agreement with preceeding results for the ph onon term, It has been observed for the first time for the roton term.