A. Filipponi et A. Dicicco, ATOMIC BACKGROUND IN X-RAY-ABSORPTION SPECTRA OF 5TH-PERIOD ELEMENTS - EVIDENCE FOR DOUBLE-ELECTRON EXCITATION EDGES, Physical review. A, 52(2), 1995, pp. 1072-1078
A systematic x-ray absorption study to detect atomic background featur
es at the K edges of fifth-period elements is reported. Samples of MoC
x (Z = 42) and pure Rh (Z = 45), Pd (Z = 46), Ag (Z = 47), In (Z = 49)
, and Sn (Z = 50) are measured at high temperature, mostly in the liqu
id phase, to reduce the intensity of the structural extended x-ray abs
orption fine structure (EXAFS) contribution. Main anomalies, showing a
regular trend as a function of Z, are identified in the region around
100 eV and in the range 200-800 eV above an edge. They are assigned t
o the opening of absorption channels creating double-hole configuratio
ns such as [1s4p], [1s, 3d], and [1s3p]. Differences of self-consisten
t calculations in the Dirac-Fock approximation have been performed and
the dominant transitions unambiguously identified. The results are re
levant for the improvement of the EXAFS analysis at these edges.