Dm. Schaefer et al., SURFACE-ROUGHNESS AND ITS INFLUENCE ON PARTICLE ADHESION USING ATOMIC-FORCE TECHNIQUES, Journal of adhesion science and technology, 9(8), 1995, pp. 1049-1062
The surface force interactions between individual 8 mu m diameter sphe
res and atomically flat substrates have been investigated using atomic
force techniques. The lift-off force of glass, polystyrene, and tin p
articles from atomically smooth mica and highly oriented pyrolitic gra
phite substrates was determined as a function of the applied loading f
orce in an inert nitrogen environment. While the relative magnitudes o
f the measured lift-off force were found to scale as expected between
the various systems studied, the absolute values were a factor of simi
lar to 50 smaller than expected from the Johnson, Kendall, and Roberts
theory. The surface topography of representative spheres was characte
rized with atomic force microscopy, allowing a quantitative assessment
of the role that surface roughness plays in the adhesion of micromete
r-size particles to substrates. Taking into account the radius of curv
ature of the asperities measured from the atomic force scans, agreemen
t between the measured and theoretical estimates for the lift-off forc
es was improved, with the corrected experimental forces about a factor
of 3 smaller than theoretical expectations.