MEASUREMENT systems often assume ideal conditions when matching impeda
nces. But impedances are rarely a precise 50 Omega, or even close to t
hat mark. For that reason, it may make sense to perform measurements a
n high frequency circuits with test probes that can match their impeda
nce to the device under test (DUT). Such probes, which are well-suited
for load-pull measurements on wireless circuits, are now available fr
om Cascade Microtech (Beaverton, OR).