EXTRACTION TECHNIQUES FOR FET SWITCH MODELING

Citation
A. Ehoud et al., EXTRACTION TECHNIQUES FOR FET SWITCH MODELING, IEEE transactions on microwave theory and techniques, 43(8), 1995, pp. 1863-1868
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
43
Issue
8
Year of publication
1995
Pages
1863 - 1868
Database
ISI
SICI code
0018-9480(1995)43:8<1863:ETFFSM>2.0.ZU;2-P
Abstract
A new simple method for extracting equivalent circuit parameters for s eries and shunt GaAs FET switches is presented, The circuit elements a re extracted from one set of S-parameter measurements for each switch state, acid scale linearly with gate width, Extracted Equivalent Circu it Parameters (ECP's) are insensitive to frequency across the measured bandwidth. Good agreement has been obtained between simulated and mod el results for a 0.5 mu m gate length series and shunt GaAs FET switch es of varying gate widths, across the 0.45-26.5 GHz band.