Pa. Engel et Sc. Chou, PLASTIC-DEFORMATION OF SOLDER JOINTS IN PIN GRID ARRAYS SUBJECTED TO THERMAL-STRESS, Journal of electronic packaging, 117(2), 1995, pp. 136-140
In an earlier work [I], thermal stresses in soldered pins were calcula
ted under the assumption of apr elastically deforming solder barrel In
the present analysis, the nonlinear, temperature dependent stress-str
ain curve of solder, without creep, is taken into account, yielding an
elasto-plastic foundation modulus function. For the thermal mismatch
loading, the total temperature range Delta T(e.g., 0-100 degrees C) is
divided into a finite number II of temperature stages, and the final
responses are superposed from the n contributions each of which done u
sing an isothermal stress calculation. Three solders (Sn-Pb solders 63
/37, 70/30, and 10/90), were investigated; the solder barrel thickness
and mismatch temperature range were also variable parameters. Compari
sons with elastic solder foundation calculation results show that ther
mal and inelastic solder stress/strain dependence should be included e
specially in the higher (over 75 degrees C) temperature range.