SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) AND ITS APPLICATION IN MINERALOGY

Authors
GUTMANNSBAUER W HUSER T LACOSTE T HEINZELMANN H GUNTHERODT HJ
Citation
W. Gutmannsbauer et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) AND ITS APPLICATION IN MINERALOGY, Schweizerische Mineralogische und Petrographische Mitteilungen, 75(2), 1995, pp. 259-264
Citations number
25
Categorie Soggetti
Mineralogy,Geology
Journal title
Schweizerische Mineralogische und Petrographische Mitteilungen → ACNP
ISSN journal
00367699
Volume
75
Issue
2
Year of publication
1995
Pages
259 - 264
Database
ISI
SICI code
0036-7699(1995)75:2<259:SNOM(A>2.0.ZU;2-T
Abstract
Scanning near-field optical microscopy (SNOM) is a member of the famil y of scanning probe microscopes. It combines the high three dimensiona l resolution of a scanning force microscope with the contrast mechanis ms of an optical microscope. An optical resolution beyond the diffract ion limit can be achieved. We show the first application of this techn ique in the field of mineralogy, and we point out its future potential .