Bs. Chiou et al., METALLURGICAL REACTIONS AT THE INTERFACE OF SN PB SOLDER AND ELECTROLESS COPPER-PLATED ALN SUBSTRATE/, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 18(3), 1995, pp. 537-542
Intermetallic formation between electroless-plated copper and Sn/Pb so
lder is investigated. An interlayer is formed between copper and solde
r, and segregation of Pb-rich and Sn-rich phases are observed. X-ray d
iffraction and EDX analysis results suggest that the major intermetall
ic formed in the interlayer is Cu6Sn5. For the as-plated sample, the a
dhesion strength of Cu to the AIN substrate after 150 degrees C aging
is affected by both the recrystallization and the creep of copper. For
the soldered specimen, the presence of intermetallic compound causes
cracks to propagate along the intermetallic/Cu interface and results i
n a decrease of the adhesion strength.