METALLURGICAL REACTIONS AT THE INTERFACE OF SN PB SOLDER AND ELECTROLESS COPPER-PLATED ALN SUBSTRATE/

Citation
Bs. Chiou et al., METALLURGICAL REACTIONS AT THE INTERFACE OF SN PB SOLDER AND ELECTROLESS COPPER-PLATED ALN SUBSTRATE/, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 18(3), 1995, pp. 537-542
Citations number
30
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Material Science
ISSN journal
10709894
Volume
18
Issue
3
Year of publication
1995
Pages
537 - 542
Database
ISI
SICI code
1070-9894(1995)18:3<537:MRATIO>2.0.ZU;2-L
Abstract
Intermetallic formation between electroless-plated copper and Sn/Pb so lder is investigated. An interlayer is formed between copper and solde r, and segregation of Pb-rich and Sn-rich phases are observed. X-ray d iffraction and EDX analysis results suggest that the major intermetall ic formed in the interlayer is Cu6Sn5. For the as-plated sample, the a dhesion strength of Cu to the AIN substrate after 150 degrees C aging is affected by both the recrystallization and the creep of copper. For the soldered specimen, the presence of intermetallic compound causes cracks to propagate along the intermetallic/Cu interface and results i n a decrease of the adhesion strength.