Kj. Randall et al., SPECTROSCOPY BEAMLINE AT THE ADVANCED PHOTON SOURCE FOR THE PHOTON ENERGY REGION FROM 0.5 TO 3 KEV, Review of scientific instruments, 66(8), 1995, pp. 4081-4086
Interest in the 0.5 to 3 keV, intermediate x-ray, energy region has re
cently intensified as this spectral region covers, among others, the i
mportant L and M edges of transition-metal and rare-earth magnetic mat
erials, respectively. Third-generation synchrotron facilities with the
ir inherent high brightness have the unique potential to cover this en
ergy region with high-resolution, high-flux x-ray beams ideal for spec
troscopic studies. A 5.5-cm-period, planar undulator to be installed o
n the 7-GeV Advanced Photon Source will produce a high brightness sour
ce of intermediate-energy x rays. The 0.5- to 3-keV spectroscopy beaml
ine is based on the spherical grating monochromator design that has al
ready been shown to yield high resolution and throughput in the soft-x
-ray region, below 1 keV. The beamline has been designed to cover the
entire region with a peak resolving power of 6000-10 000. Photon flux
at the sample is calculated to be in the range from 10(11) to 10(13) p
hotons/s into a spot size of 1 mm(2). A refocusing mirror will be used
to further demagnify the image size at a second experimental station.
As a second phase to the spectroscopy program, an elliptically polari
zed insertion device will be used. The polarization preserving nature
of the grazing incidence optical elements in the SGM is crucial to obt
ain x rays of well-defined polarization. The beamline layout, together
with calculations of resolution, throughput, power loading, and high
harmonic suppression, will be presented. The photoemission experimenta
l end stations for the spectroscopy station will also be briefly descr
ibed. (C) 1995 American Institute of Physics.