FLUX MEASUREMENT FOR X-RAY PHOTOELECTRON-SPECTROSCOPY

Citation
Dm. Wieliczka et al., FLUX MEASUREMENT FOR X-RAY PHOTOELECTRON-SPECTROSCOPY, Review of scientific instruments, 66(8), 1995, pp. 4387-4388
Citations number
6
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
66
Issue
8
Year of publication
1995
Pages
4387 - 4388
Database
ISI
SICI code
0034-6748(1995)66:8<4387:FMFXP>2.0.ZU;2-R
Abstract
A simple modification of a commercial aluminum anode x-ray source allo ws for the direct measurement of the x-ray flux. The modification invo lves a biased wire after the Al filter used to block the bremsstrahlun g radiation. The current collected by this wire was measured to be log arithmic in bias voltage but linear in power supply setting. The colle ctor wire was used to monitor the x-ray flux over a period of approxim ately 1 yr and shows the degradation of the flux due to anode contamin ation. Using the measured x-ray flux platinum photoelectron spectra we re normalized to within 20% over a 1 yr period and to 2% over a 1 week period. (C) 1995 American Institute of Physics.