F. Lepoutre et al., MICRON-SCALE THERMAL CHARACTERIZATIONS OF INTERFACES PARALLEL OR PERPENDICULAR TO THE SURFACE, Journal of applied physics, 78(4), 1995, pp. 2208-2223
Theoretical and experimental possibilities are presented of a modulate
d photothermal method, laser-induced photoreflectance, for inspecting
thermal diffusivities and quality of interfaces in composite materials
with micron-scale spatial resolutions. The models are established for
semi-infinite materials containing interfaces parallel or perpendicul
ar to the sample surface. The applications concern thermal diffusivity
measurements of anisotropic polycrystals and detection of thermal res
istance in damaged materials and at interfaces between reinforcements
and matrix in composites. (C) 1995 American Institute of Physics.