OXYGEN DEFECT CENTER RED ROOM-TEMPERATURE PHOTOLUMINESCENCE FROM FRESHLY ETCHED AND OXIDIZED POROUS SILICON

Citation
Sm. Prokes et We. Carlos, OXYGEN DEFECT CENTER RED ROOM-TEMPERATURE PHOTOLUMINESCENCE FROM FRESHLY ETCHED AND OXIDIZED POROUS SILICON, Journal of applied physics, 78(4), 1995, pp. 2671-2674
Citations number
35
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
4
Year of publication
1995
Pages
2671 - 2674
Database
ISI
SICI code
0021-8979(1995)78:4<2671:ODCRRP>2.0.ZU;2-F
Abstract
Electron spin resonance and photoluminescence experiments have been pe rformed on freshly etched and oxidized porous silicon. Results indicat e the presence of oxygen-related centers (nonbridging oxygen-hole cent er clusters), which consist of similar core structures in as-made and oxidized porous silicon (PSi) samples. A direct correlation exists bet ween the presence of these centers and a red photoluminescence observe d in both freshly anodized and oxidized PSi, suggesting that this emis sion process is the result of optical transitions in the oxygen-hole c enters.