Mh. Ramsey et al., AN OBJECTIVE ASSESSMENT OF ANALYTICAL METHOD PRECISION - COMPARISON OF ICP-AES AND XRF FOR THE ANALYSIS OF SILICATE ROCKS, Chemical geology, 124(1-2), 1995, pp. 1-19
The precision of an analytical method has been evaluated objectively b
y applying the method of Thompson and Howarth (1976) to the analysis i
n duplicate of 55 igneous rocks covering a range of silicate matrix ty
pes and analyte concentrations. Results were analysed to characterise
the change in precision (S-c) of the analytical method with concentrat
ion (c) according to the equation S-c=S-o+kc, where the k parameter re
presents the limiting high-level precision and S-o, the precision at z
ero concentration, which is related to the method detection limit (MDL
), Test materials were analysed using four analytical methods based on
two analytical techniques, inductively coupled plasma-atomic emission
spectrometry (ICP-AES) and X-ray fluorescence spectrometry (XRF), as
operated under routine working conditions in the two participating lab
oratories. The two XRF methods were major elements on fused glass disc
s and trace elements on powder pellets, and the two ICP-AES methods we
re major elements after a fusion decomposition technique and trace ele
ments together with selected major elements, after an acid attack. Sta
tistical evaluation of the data showed that significant changes in pre
cision as a function of concentration (i.e. the k factor) were determi
ned in 34 cases out of 78 analyte-method combinations. In cases where
no significant change in precision could be detected, a grand mean pre
cision, representative of the concentration range analysed was calcula
ted. The S-o parameter was found to be significantly different from ze
ro in 36 cases out of 72. To allow evaluation of the detection limit p
erformance of all data, a maximum method detection limit (MMDL) was ca
lculated, which was estimated to be on average 1.62 times greater than
the MDL derived from significant values of S-o. In terms of the four
methods studied, median high-level precision of the techniques used to
determine major elements were found to be 0.23% relative (XRF/glass d
iscs), 0.43% (ICP-AES/fusion decomposition) and 0.70% (ICP-AES/acid at
tack). Typical precision values in the determination of trace elements
by both techniques was 1.5%, providing elemental concentrations exten
ded over a significant range. MMDL's varied from element to element bu
t for XRF/powder pellet data were found to be approximately equivalent
to instrumental detection limits (IDL's) calculated from background c
ount rates. However, for trace elements determined by ICP-AES/acid att
ack, MMDL were found to be on average three times larger than IDL's me
asured from repeated analysis of an aqueous blank. As a result of an e
valuation of these data, it is proposed that appropriate figures of me
rit to describe the analytical performance of a technique are: (1) med
ian precision in the determination of major elements; and (2) the numb
er of trace elements that can be determined to MDL's of less than one-
tenth the crustal abundance of the element. These factors should then
be evaluated in conjunction with logistical factors including the rate
at which samples can be analysed and the cost per determination. The
influence of these factors on applications of the techniques studied i
n pure and applied geochemistry are discussed.