We discuss our results on the transport properties of YBCO thin films
deposited on ultra-thin (1-11 nm) Ag underlayers. Samples were of the
form: YBCO/Ag/LaAlO3. It was seen that T-c remained relatively unaffec
ted by the Ag underlayers, ranging from 86 - 89K. Critical currents ge
nerally decreased with increasing Ag underlayer thickness, but showed
an apparent significant enhancement for 8 nm of underlayer thickness.
Film resistivity was found to be consistently higher for all underlaye
r thicknesses.