THE SPUTTER-DEPOSITION OF CERIUM OXIDE THIN-FILMS FOR SUPERCONDUCTIONELECTRONICS

Citation
Jm. Owens et al., THE SPUTTER-DEPOSITION OF CERIUM OXIDE THIN-FILMS FOR SUPERCONDUCTIONELECTRONICS, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 1657-1660
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
5
Issue
2
Year of publication
1995
Part
2
Pages
1657 - 1660
Database
ISI
SICI code
1051-8223(1995)5:2<1657:TSOCOT>2.0.ZU;2-#
Abstract
Thin films of cerium oxide (CeO2) have been deposited by r.f. reactive sputter deposition on yttria-stabilised zirconia (YSZ) and on YBCO th in films on lanthanum aluminate (LaAlO3) substrates. Subsequent growth of YBa2Cu3O(7-x) (YBCO) by high pressure d.c. sputtering has yielded superconducting transition temperatures (T-c's) of 89-91 K for unpatte rned YBCO films. CeO2 thin films have been patterned and subsequent YB CO growth has been examined. Oxygenation levels were monitored between growth and patterning stages by X-ray diffraction (XRD).A YBCO track has been fabricated crossing steps in a CeO2 buffer layer. A critical current density (J(c)) of 0.8 x 10 Am-10(-2) at 77 K as compared with 1 x 10 (10) Am-2 for a flat YBCO track on flat CeO2 was measured. Cros sover test structures were made, having T,'s of 89-91K for top and 80- 90K for the bottom YBCO electrodes. A 400 nm thickness of CeO2 was suf ficient to insulate two superconducting layers and found to have a res istivity of 2x10(7) Omega m at 77K.