HIGH-FREQUENCY SURFACE IMPEDANCE AND PENETRATION DEPTH OF YBA2CU3O7 FILMS - COHERENT TIME-DOMAIN SPECTROSCOPY METHOD

Citation
F. Gao et al., HIGH-FREQUENCY SURFACE IMPEDANCE AND PENETRATION DEPTH OF YBA2CU3O7 FILMS - COHERENT TIME-DOMAIN SPECTROSCOPY METHOD, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 1970-1974
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
5
Issue
2
Year of publication
1995
Part
2
Pages
1970 - 1974
Database
ISI
SICI code
1051-8223(1995)5:2<1970:HSIAPD>2.0.ZU;2-V
Abstract
The transmission (T) and phase shift (theta) of 0.2-1.5 THz radiation have been measured simultaneously on unpatterned, high-quality YBa2Cu3 O7 films (T-c 90 K) in the normal and superconducting states using a c oherent, pulsed, time-domain technique. The complex surface impedance has been extracted without contacting or patterning the superconductin g films using T and theta. Above T-c, both the real (R(s)) and imagina ry (X(s)) parts show a metallic root omega T dependence with almost eq ual magnitude as predicted by the normal skin effect. Below T-c, R(s) scales with omega(2), but only for omega/2 pi less than or equal to 40 0 GHz; it increases more slowly with frequency above 400 GHz. The reac tance X(s) is linear in omega for T << T-c, but follows a weaker power dependence with frequency at higher temperatures, indicating that the penetration depth is also frequency dependent. We attribute these fea tures to a rapid decrease of the quasiparticle relaxation rate, 1/tau, in the super-conducting state (where 1/tau is comparable to the photo n energy of the THz beam), and a significant influence of the remainin g normal carriers in the THz regime. Differences between the microwave and submillimeter-wave responses will be discussed.